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Volumn 26, Issue 7, 2004, Pages 31-34
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Possible low-k solution and other potential applications
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Author keywords
[No Author keywords available]
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Indexed keywords
BUFFERS;
CRYPTOCRYSTALLINE MATERIALS;
LATTICE MISMATCHES;
SPIN-ON TECHNOLOGY;
CHEMICAL VAPOR DEPOSITION;
COST EFFECTIVENESS;
CRYPTOGRAPHY;
CRYSTAL LATTICES;
ELECTRIC CONTACTS;
ETCHING;
MOLECULAR BEAM EPITAXY;
PERMITTIVITY;
RELIABILITY;
SILICON WAFERS;
VAPORS;
INTEGRATED CIRCUIT MANUFACTURE;
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EID: 3142732752
PISSN: 02656027
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (0)
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