Enhancement of critical current density in YBa2Cu 3O7-δ thin films grown using PLD on YSZ (001) surface modified with Ag nano-dots

Journal of Physics D: Applied Physics

Volumn 37, Issue 13, 2004, Pages 1824-1828

  Ionescu, M ^a   Li, A H ^a   Zhao, Y ^a   Liu, H K ^a   Crisan, A ^b,c  

^a UNIVERSITY OF WOLLONGONG   (Australia)

^b University of Bath   (United Kingdom)

^c NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; PULSED LASER DEPOSITION; SEMICONDUCTOR QUANTUM DOTS; SILVER; THIN FILMS; X RAY DIFFRACTION ANALYSIS; YTTRIUM;

DC MAGNETIZATION; NANO-DOTS; SECONDARY ELECTRON MICROSCOPY;

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);

EID: 3142719962     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/13/014     Document Type: Article

References (3)

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3. Crisan A, Fujiwara S, Nie J C, Sundaresan A and Ihara H 2001 Appl. Phys. Lett. 79 4547