Neutron irradiated copper: Is the main positron lifetime component due to stacking fault tetrahedra?

Materials Science Forum

Volumn 445-446, Issue , 2004, Pages 21-25

  Eldrup, M ^a   Singh, B N ^a   Edwards, D J ^b   Nagai, Y ^c   Ohkubo, H ^c   Hasegawa, M ^c  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

Copper; Defects; Neutron Irradiation; Positron Annihilation Spectroscopy; Positron Trapping Rates; Stacking Fault Tetrahedra; Transmission Electron Microscopy

Indexed keywords

ELECTRON TRAPS; NEUTRON IRRADIATION; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; STACKING FAULTS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

POSITRON TRAPPING RATES; STACKING FAULT TETRAHEDRA (SFT);

COPPER;

EID: 3142711819     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.445-446.21     Document Type: Conference Paper

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