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Materials Science Forum

Volumn 445-446, Issue , 2004, Pages 204-206

Characterisation of defects in simulated nanostructures

(6) Van Petegem, S a,c Kuriplach, J b Van Swygenhoven, H c Meyer, R d Dauwe, C a Segers, D a

a GHENT UNIVERSITY (Belgium)

b CHARLES UNIVERSITY (Czech Republic)

c PAUL SCHERRER INSTITUTE (Switzerland)

d UNIVERSITY OF DUISBURG ESSEN (Germany)

Author keywords

Grain Boundaries; Molecular Dynamics; Nanocrystalline; Ni; Positron Lifetime Calculations; Vacancy Like Defects

Indexed keywords

COMPUTER SIMULATION; CONDENSATION; CRYSTAL DEFECTS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; INERT GASES; LOW TEMPERATURE ENGINEERING; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; NICKEL; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

GRAIN BOUNDARIES (GB); NANOCRYSTALLINE; POSITRON LIFETIME CALCULATIONS; VACANCY-LIKE DEFECTS;

NANOSTRUCTURED MATERIALS;

EID: 3142707520 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.445-446.204 Document Type: Conference Paper

Times cited : (3)

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