In situ Micro Raman Spectroscopy for characterization of oxide film formed on the new surface and for measurements of the stress of oxide film formed on 304L stainless steel

Key Engineering Materials

Volumn 261-263, Issue II, 2004, Pages 913-918

  Kai, Akira ^a   Takegoshi, Masao ^a   Shoji, Tetsuo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Film rupture; In situ measurement; Micro Raman Spectroscopy; New surface; Oxide film; Scratch electrode; SSRT; Stainless steel

Indexed keywords

CRACK INITIATION; CRACK PROPAGATION; ELECTRODES; MAGNETIC SUSCEPTIBILITY; RAMAN SPECTROSCOPY; STRAIN RATE; STRESS CORROSION CRACKING; SURFACE TREATMENT; THIN FILMS;

FILM RUPTURE; IN SITU MEASUREMENTS; MICRO RAMAN SPECTROSCOPY; OXIDE FILMS; SCRATCH ELECTRODES; SSRT;

STAINLESS STEEL;

EID: 3142701374     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (4)

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3. S. Nakashima, Y. Inoue, M. Miyauchi, A. Mitsuishi, T. Fukumoto, Y. Akasaka, J. appl. phys., 54 (1983) pp2611
4. J. Birnie, C. Craggs, D. J. Gradiner, and P. R. Graves, Corrosion Sci., 33 (1992)pp1