Depth-resolved whole-field displacement measurement using wavelength scanning interferometry

Journal of Optics A: Pure and Applied Optics

Volumn 6, Issue 7, 2004, Pages 679-683

  Ruiz, Pablo D ^a   Zhou, Yanzhou ^a   Huntley, Jonathan M ^a   Wildman, Ricky D ^a  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

Depth resolved; Displacement measurements; Phase shifting; Wavelength scanning interferometry; Wavelength tuning

Indexed keywords

APPROXIMATION THEORY; FOURIER TRANSFORMS; INTERFEROMETRY; LIGHT REFLECTION; LIGHT SCATTERING; PHASE SHIFT; SIGNAL GENERATORS;

DEPTH-RESOLUTION; DISPLACEMENT MEASUREMENTS; WAVELENGTH SCANNING INTERFEROMETRY; WAVELENGTH TUNING;

SCANNING;

EID: 3142690050     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/6/7/004     Document Type: Article

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