SCOPUS 정보 검색 플랫폼

Physica Status Solidi (A) Applied Research

Volumn 201, Issue 8, 2004, Pages 1755-1758

Bilayers thickness effect on the magnetic properties of [Fe/Pt]n films

(4) Chou, S C a Yu, C C a Liou, Y a Yao, Y D a

a INSTITUTE OF PHYSICS (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; CRYSTAL ORIENTATION; MAGNETIC ANISOTROPY; MOLECULAR BEAM EPITAXY; MULTILAYERS; PLATINUM; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SQUIDS; SUBSTRATES; THICKNESS MEASUREMENT; X RAY DIFFRACTION;

FILM STRUCTURES; MAGNETIC FORCE MICROSCOPY (MFM); SCANNING PROBE MICROSCOPY; STRUCTURAL TRANSFORMATIONS;

IRON;

EID: 3142677330 PISSN: 00318965 EISSN: None Source Type: Journal
DOI: 10.1002/pssa.200304529 Document Type: Conference Paper

Times cited : (5)

References (12)

1
- 0035386775
- D. J. Sellmyer, C. P. Luo, M. L. Yan, and Y. Liu, IEEE Trans. Magn. 37, 1286 (2001).
- (2001) IEEE Trans. Magn. , vol.37 , pp. 1286
- Sellmyer, D.J.¹ Luo, C.P.² Yan, M.L.³ Liu, Y.⁴

2
- 0001092244
- R. F. C. Farrow, D. Weller, R. F. Marks, M. F. Toney, S. Horn, G. R. Harp, and A. Cebollada, Appl. Phys. Lett. 69, 1166 (1996).
- (1996) Appl. Phys. Lett. , vol.69 , pp. 1166
- Farrow, R.F.C.¹ Weller, D.² Marks, R.F.³ Toney, M.F.⁴ Horn, S.⁵ Harp, G.R.⁶ Cebollada, A.⁷

3
- 0033886632
- D. Weller, A. Moser, L. Folk, M. E. Best, W. Lee, M. F. Toney, M. F. Schwickert, J. U. Thiele, and M. F. Doerner, IEEE Trans. Magn. 36, 10 (2000).
- (2000) IEEE Trans. Magn. , vol.36 , pp. 10
- Weller, D.¹ Moser, A.² Folk, L.³ Best, M.E.⁴ Lee, W.⁵ Toney, M.F.⁶ Schwickert, M.F.⁷ Thiele, J.U.⁸ Doerner, M.F.⁹

4
- 36449007825
- M. R. Visokay and R. Sinclair, Appl. Phys. Lett. 66, 1692 (1995).
- (1995) Appl. Phys. Lett. , vol.66 , pp. 1692
- Visokay, M.R.¹ Sinclair, R.²

5
- 0029403411
- C. P. Luo and D. J. Sellmyer, IEEE Trans. Magn. 31, 2764 (1995).
- (1995) IEEE Trans. Magn. , vol.31 , pp. 2764
- Luo, C.P.¹ Sellmyer, D.J.²

6
- 79957941534
- T. Shima, T. Moriguchi, S. Mitani, and K. Takanashi, Appl. Phys. Lett. 80, 288 (2002).
- (2002) Appl. Phys. Lett. , vol.80 , pp. 288
- Shima, T.¹ Moriguchi, T.² Mitani, S.³ Takanashi, K.⁴

7
- 79956047732
- T. Maeda, T. Kai, A. Kikitsu, T. Nagase, and J. Akiyama, Appl. Phys. Lett. 80, 2147 (2002).
- (2002) Appl. Phys. Lett. , vol.80 , pp. 2147
- Maeda, T.¹ Kai, T.² Kikitsu, A.³ Nagase, T.⁴ Akiyama, J.⁵

8
- 0035356668
- Y-N. Hsu, S. Jeong, D. E. Laughlin, and D. N. Lambeth, J. Appl. Phys. 89, 7068 (2001).
- (2001) J. Appl. Phys. , vol.89 , pp. 7068
- Hsu, Y.-N.¹ Jeong, S.² Laughlin, D.E.³ Lambeth, D.N.⁴

9
- 0033100072
- T. Suzuki, K. Harada, N. Honda, and K. Ouchi, J. Magn. Magn. Mater. 193, 85 (1999).
- (1999) J. Magn. Magn. Mater. , vol.193 , pp. 85
- Suzuki, T.¹ Harada, K.² Honda, N.³ Ouchi, K.⁴

10
- 79957929666
- Y. Xu, J. S. Chen, and J. P. Wang, Appl. Phys. Lett. 80, 3325 (2002).
- (2002) Appl. Phys. Lett. , vol.80 , pp. 3325
- Xu, Y.¹ Chen, J.S.² Wang, J.P.³

11
- 0011931576
- D. Ravelosona, C. Chappert, V. Mathet, and H. Bernas, J. Appl. Phys. 87, 5771 (2000).
- (2000) J. Appl. Phys. , vol.87 , pp. 5771
- Ravelosona, D.¹ Chappert, C.² Mathet, V.³ Bernas, H.⁴

12
- 0037637427
- C. C. Yu, W. C. Cheng, W. B. Lee, S. Y. Chen, D. C. Chen, Y. Liou, and Y. D. Yao, J. Appl. Phys. 93, 7468 (2003).
- (2003) J. Appl. Phys. , vol.93 , pp. 7468
- Yu, C.C.¹ Cheng, W.C.² Lee, W.B.³ Chen, S.Y.⁴ Chen, D.C.⁵ Liou, Y.⁶ Yao, Y.D.⁷

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.