Electron microscopy characterization of Ba(Cd1/3Ta2/3)O3 microwave dielectrics with boron additive

Journal of Materials Research

Volumn 19, Issue 5, 2004, Pages 1387-1391

  Sun, J ^a,b   Liu, Shaojun ^c   Newman, N ^c   McCartney, M R ^a   Smith, David J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

^c Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADDITIVES; BORON; CERAMIC MATERIALS; COMPOSITION EFFECTS; DIELECTRIC MATERIALS; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; MICROSTRUCTURE; MICROWAVES; PHASE COMPOSITION; REFLECTION; SUPERLATTICES;

AMORPHOUS PHASE; MICROWAVE DIELECTRICS; MULTIPLE GRAIN JUNCTIONS; PSEUDOCUBIC PEROVSKITE UNIT CELL; SUPERLATTICE REFLECTIONS;

BARIUM COMPOUNDS;

EID: 3142664495     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0185     Document Type: Article

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