Elastic stiffness of interfaces studied by Rayleigh waves

Materials Science and Engineering: A

Volumn 375-377, Issue 1-2 SPEC. ISS., 2004, Pages 194-200

  Schwarz, R B ^a   Harms, U ^a   Jain, H ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b Lehigh University   (United States)

Author keywords

Elastic modulus; Interfaces; Rayleigh waves; Thin films; XPS

Indexed keywords

ELASTICITY; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; STIFFNESS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; FILM PREPARATION; NANOCRYSTALLINE MATERIALS; RAYLEIGH WAVES;

ELASTIC STIFFNESS; METAL-METAL COMBINATIONS; ALLOY THIN FILMS; ELEMENTAL THIN FILMS; FILM/SUBSTRATE; MEASURE IN SITU; METAL COMBINATION; PROPERTY; STIFFNESS CHANGES; THIN-FILMS; TRANSIENT EFFECT;

MATERIALS SCIENCE; NANOCRYSTALS;

RAYLEIGH NUMBER;

EID: 3142664079     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2003.10.177     Document Type: Article

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