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Volumn 53, Issue 2, 1997, Pages 225-227

4-Bromo-2,6-dichlorobenzonitrile

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; MOLECULAR STRUCTURE;

EID: 3142641251     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270196012656     Document Type: Article
Times cited : (4)

References (14)
  • 1
    • 0003523822 scopus 로고
    • DIRDIF. Direct Methods for Difference Structures - An Automatic Procedure for Phase Extension and Refinement of Difference Structure Factors
    • Crystallography Laboratory, Toernooiveld, 6525 ED Nijmegen, The Netherlands
    • Beurskens, P. T. (1984). DIRDIF. Direct Methods for Difference Structures - an Automatic Procedure for Phase Extension and Refinement of Difference Structure Factors. Technical Report 1984/1. Crystallography Laboratory, Toernooiveld, 6525 ED Nijmegen, The Netherlands.
    • (1984) Technical Report 1984/1
    • Beurskens, P.T.1
  • 8
    • 0003479375 scopus 로고
    • MSC, 3200 Research Forest Drive, The Woodlands, TX 77381, USA
    • Molecular Structure Corporation (1985). TEXSAN. TEXRAY Structure Analysis Package. MSC, 3200 Research Forest Drive, The Woodlands, TX 77381, USA.
    • (1985) TEXSAN. TEXRAY Structure Analysis Package
  • 12
    • 84871220249 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1994). SHELXTL. Version 5.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1994) SHELXTL. Version 5.0
    • Sheldrick, G.M.1
  • 13
    • 0003439214 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1995a). ASTRO. Data Collection Software for the SMART System. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1995) ASTRO. Data Collection Software for the SMART System
  • 14
    • 0003439214 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1995b). SAINT. Data Processing Software for the SMART System. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1995) SAINT. Data Processing Software for the SMART System


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.