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Volumn 17, Issue 4, 2004, Pages 603-607
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Development status of high performance materials for immersion lithography
a a a a |
Author keywords
Cover material; Elution; Immersion lithography; Water
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Indexed keywords
ACID;
AMINE;
THINNER;
ANALYTIC METHOD;
AQUEOUS SOLUTION;
ARTICLE;
CHEMICAL ANALYSIS;
CHEMICAL REACTION;
CHEMICAL STRUCTURE;
DEVICE;
ELECTRON BEAM;
ELUTION;
EVALUATION;
IMAGING SYSTEM;
IMMERSION LITHOGRAPHY;
LIQUID;
MATERIAL COATING;
MOLECULAR WEIGHT;
OPTICS;
PARAMETER;
PERFORMANCE;
PHYSICOCHEMICAL MODEL;
SEMICONDUCTOR;
SYNTHESIS;
TECHNIQUE;
TEMPERATURE DEPENDENCE;
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EID: 3142582525
PISSN: 09149244
EISSN: None
Source Type: Journal
DOI: 10.2494/photopolymer.17.603 Document Type: Article |
Times cited : (19)
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References (13)
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