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Volumn 17, Issue 4, 2004, Pages 603-607

Development status of high performance materials for immersion lithography

Author keywords

Cover material; Elution; Immersion lithography; Water

Indexed keywords

ACID; AMINE; THINNER;

EID: 3142582525     PISSN: 09149244     EISSN: None     Source Type: Journal    
DOI: 10.2494/photopolymer.17.603     Document Type: Article
Times cited : (19)

References (13)
  • 12
    • 3142617138 scopus 로고    scopus 로고
    • TOK resist & material development status for immersion lithography
    • January
    • M. Sato, "TOK Resist & Material Development Status for Immersion Lithography", Litho Forum in Los Angeles, January, 2004
    • (2004) Litho Forum in Los Angeles
    • Sato, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.