Chapter 7 Thermomagnetic effects and measurements

Semiconductors and Semimetals

Volumn 70, Issue C, 2001, Pages 207-244

  Freibert, Franz ^a   Darling, Timothy W ^a   Migliori, Albert ^a   Trugman, Stuart A ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HALL MOBILITY; HOLE MOBILITY; REFRIGERATION; TEMPERATURE DISTRIBUTION; TRANSPORT PROPERTIES;

ELECTRONIC REFRIGERATION; PHYSICAL TRANSPORT; SCATTERING MECHANISMS; SOLID-STATE SYSTEM; TEMPERATURE DEPENDENCE; THERMOMAGNETIC EFFECT; TRANSPORT COEFFICIENT; TRANSPORT EFFECTS;

CARRIER CONCENTRATION;

EID: 3142557832     PISSN: 00808784     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0080-8784(01)80141-1     Document Type: Article

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