High frequency measurements of P-E hysteresis curves of PZT thin films

Ferroelectrics

Volumn 259, Issue 1, 2001, Pages 43-48

  Tsurumi, Takaaki ^a   Num, Song Min ^a   Kil, Young Bae ^a   Wada, Satoshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

domain structure; ferroelectrics; PZT; thin films

Indexed keywords

COERCIVE FIELD; CONTROLLED MODEL; DOMAIN STRUCTURE; DOMAIN SWITCHINGS; FERROELECTRIC MEMORY; FERROELECTRICS; FUNCTION OF FREQUENCY; HIGH FREQUENCY; HIGH FREQUENCY MEASUREMENTS; HYSTERESIS CURVE; MEASURING FREQUENCY; OPERATING SPEED; PZT; PZT THIN FILM; REMANENT POLARIZATION;

CRYSTALS; HYSTERESIS; THIN FILMS; VAPOR DEPOSITION;

FERROELECTRIC FILMS;

EID: 3142554490     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190108008714     Document Type: Conference Paper

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