MINING EVENT DATA FOR ACTIONABLE PATTERNS

26th International Computer Measurement Group Conference, CMG 2000

Volumn , Issue , 2000, Pages

  Hellerstein, Joseph L ^a   Ma, Sheng ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PRINTING PRESSES;

CENTRAL PROBLEMS; CORRELATION RULE; ERROR PRONES; EVENT MANAGEMENT; MANAGEMENT IS; MINING ALGORITHMS;

DATA MINING;

EID: 3142546405     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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