Application of quasi-optical dielectric cavity resonators for measuring microwave characteristics of dielectric and conducting materials

Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika)

Volumn 55, Issue 12, 2001, Pages 81-90

  Barannik, A A ^a   Prokopenko, Yu V ^a   Filippov, Yu F ^a   Cherpak, N T ^a  

^a A USIKOV INSTITUTE OF RADIO PHYSICS AND ELECTRONICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC DEVICES; MICROWAVE RESONATORS; MILLIMETER WAVES; PERMITTIVITY; Q FACTOR MEASUREMENT; SURFACE RESISTANCE;

CONDUCTING MATERIALS; CYLINDRICAL RESONATOR; DIELECTRIC CAVITIES; MICROWAVE CHARACTERISTICS; MILLIMETER WAVELENGTH; QUASI-OPTICAL DIELECTRIC RESONATORS; QUASI-OPTICAL RESONATOR; SPECTRAL CHARACTERISTICS;

DIELECTRIC MATERIALS;

EID: 3142540817     PISSN: 00402508     EISSN: 19436009     Source Type: Journal    
DOI: 10.1615/TelecomRadEng.v55.i12.80     Document Type: Article

References (6)

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6. Velichko A.V., Cherpak N.T., Izhyk S.N., Kirichenko A.Ya. and Moroz A.V. Microwave power dependent surface resistance of YBeCuO superconductors: material quality linkage // Supercond. Sci. Technic. - 1998. - Vol. 11.- P.716-729.