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Volumn 20, Issue 2, 2005, Pages 105-108

Investigation of the microstructure of energetic crystals by means of X-ray powder diffraction

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC LINE BROADENING; CHARACTERISTIC LINE BROADENING; CYCLIC NITRAMINES; DISLOCATION SLIP; LINE BROADENING; MECHANICAL SENSITIVITY; STRAIN FIELDS; WILLIAMSON-HALL PLOT;

EID: 31344465730     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1913709     Document Type: Conference Paper
Times cited : (14)

References (10)
  • 4
    • 31344447832 scopus 로고    scopus 로고
    • Proc. 29th Int. Annual Conf. of ICT, 651-6511.
    • Heijden, A. E. D. M. v. d. and Bouma, R. H. B. (1998). Proc. 29th Int. Annual Conf. of ICT, 651-6511.
    • (1998)
    • v d Heijden, A.E.D.M.1    Bouma, R.H.B.2
  • 5
    • 31344437922 scopus 로고    scopus 로고
    • Proc. 29th Int. Annual Conf. of ICT, 661-6518.
    • Kröber, H., Teipel, U., Leisinger, K., and Krause, H. (1998). Proc. 29th Int. Annual Conf. of ICT, 661-6518.
    • (1998)
    • Kröber, H.1    Teipel, U.2    Leisinger, K.3    Krause, H.4
  • 6
    • 31344451721 scopus 로고    scopus 로고
    • National Institute of Standards and Technology
    • National Institute of Standards and Technology (2000). NIST Certificate of SRM 660a (Gaithersburg, MD).
    • (2000)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.