X-ray photoelectron diffraction study of Cu(1 1 1): Multiple scattering investigation

Surface Science

Volumn 600, Issue 2, 2006, Pages 380-385

  Despont, L ^a   Naumovic D ^b   Clerc, F ^a   Koitzsch, C ^a   Garnier, M G ^a   Garcia De Abajo, F J ^c   Van Hove, M A ^d   Aebi, P ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b UNIVERSITY OF FRIBOURG   (Switzerland)

^c CENTRO MIXTO CSIC UPV EHU   (Spain)

^d CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Copper; Diffraction; Electron solid interaction; Multiple scattering; Photoelectron diffraction; Scattering

Indexed keywords

COMPUTER SIMULATION; SCATTERING; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON SOLID INTERACTION; MULTIPLE SCATTERING; PHOTOELECTRON DIFFRACTION;

COPPER COMPOUNDS;

EID: 31344445179     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.10.038     Document Type: Article

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