-
2
-
-
0001684112
-
-
M. Bayer, V.B. Timofeev, F. Faller, T. Gutbrod, A. Forchel, Phys. Rev. B 54, 8799 (1996).
-
(1996)
Phys. Rev. B
, vol.54
, pp. 8799
-
-
Bayer, M.1
Timofeev, V.B.2
Faller, F.3
Gutbrod, T.4
Forchel, A.5
-
3
-
-
0000581705
-
-
M.N. Islam, R.L. Hillman, D.A.B. Miller, D.S. Chemla, A.C. Gossard, J.H. English, Appl. Phys. Lett. 50, 1098 (1987).
-
(1987)
Appl. Phys. Lett.
, vol.50
, pp. 1098
-
-
Islam, M.N.1
Hillman, R.L.2
Miller, D.A.B.3
Chemla, D.S.4
Gossard, A.C.5
English, J.H.6
-
5
-
-
0000470103
-
-
Y.J. Chen, E.S. Koteles, B.S. Elman, C.A. Armiento, Phys. Rev. B 36, 4562 (1987).
-
(1987)
Phys. Rev. B
, vol.36
, pp. 4562
-
-
Chen, Y.J.1
Koteles, E.S.2
Elman, B.S.3
Armiento, C.A.4
-
6
-
-
0000062795
-
-
S.R. Andrews, C.M. Murray, A.A. Davies, T.M. Kerr, Phys. Rev. B 37, 8198 (1988).
-
(1988)
Phys. Rev. B
, vol.37
, pp. 8198
-
-
Andrews, S.R.1
Murray, C.M.2
Davies, A.A.3
Kerr, T.M.4
-
10
-
-
0034664512
-
-
T. Wang, M. Bayer, A. Forchel, N.A. Gippius, V. Kulakovskii, Phys. Rev. B 62, 7433 (2000).
-
(2000)
Phys. Rev. B
, vol.62
, pp. 7433
-
-
Wang, T.1
Bayer, M.2
Forchel, A.3
Gippius, N.A.4
Kulakovskii, V.5
-
11
-
-
0346333263
-
-
[il] G. Sȩk, K. Ryczko, M. Kubisa, J. Misiewicz, J. Koeth, A. Forchel, Opto-electronics Rev. 7, 117 (1999).
-
(1999)
Opto-electronics Rev.
, vol.7
, pp. 117
-
-
Sȩk, G.1
Ryczko, K.2
Kubisa, M.3
Misiewicz, J.4
Koeth, J.5
Forchel, A.6
-
12
-
-
0012375406
-
-
Eds. M.L. Sadowski, M. Potemski, M. Grynberg, Kluwer Academic Publishers, Dordrecht
-
G. Sȩk, K. Ryczko, M. Ciorga, L. Bryja, M. Kubisa, J. Misiewicz, M. Bayer, J. Koeth, A. Forchel, in: Proc. of Advanced Research NATO Workshop on Optical Properties of Semiconductor Nanostructures, Eds. M.L. Sadowski, M. Potemski, M. Grynberg, Kluwer Academic Publishers, Dordrecht 2000, p. 91.
-
(2000)
Proc. of Advanced Research NATO Workshop on Optical Properties of Semiconductor Nanostructures
, pp. 91
-
-
Sȩk, G.1
Ryczko, K.2
Ciorga, M.3
Bryja, L.4
Kubisa, M.5
Misiewicz, J.6
Bayer, M.7
Koeth, J.8
Forchel, A.9
-
13
-
-
0033885361
-
-
G. Sȩk, K. Ryczko, M. Kubisa, J. Misiewicz, M. Bayer, T. Wang, J. Koeth, A. Forchel, Thin Solid Films 364, 220 (2000).
-
(2000)
Thin Solid Films
, vol.364
, pp. 220
-
-
Sȩk, G.1
Ryczko, K.2
Kubisa, M.3
Misiewicz, J.4
Bayer, M.5
Wang, T.6
Koeth, J.7
Forchel, A.8
-
14
-
-
0003655101
-
-
Oficyna Wydawnicza Politechniki Wrocławskiej, Wrocław
-
J. Misiewicz, P. Sitarek, G. Sȩk, Introduction to the Photoreflectance Spectroscopy of Semiconductor Structures, Oficyna Wydawnicza Politechniki Wrocławskiej, Wrocław 1999, p. 19.
-
(1999)
Introduction to the Photoreflectance Spectroscopy of Semiconductor Structures
, pp. 19
-
-
Misiewicz, J.1
Sitarek, P.2
Sȩk, G.3
-
18
-
-
0040444038
-
-
G. Arnaud, J. Allegre, P. Lefebvre, H. Mathieu, L.K. Howard, D.J. Dunstan, Phys. Rev. B 46, 15290 (1992).
-
(1992)
Phys. Rev. B
, vol.46
, pp. 15290
-
-
Arnaud, G.1
Allegre, J.2
Lefebvre, P.3
Mathieu, H.4
Howard, L.K.5
Dunstan, D.J.6
-
19
-
-
0029509642
-
-
L.C. Andreani, D. De Nova, S. Di Lernia, M. Geddo, G. Guizzetti, M. Patrini, C. Bocchi, A. Bosacchi, C. Ferrari, S. Franchi, J. Appl. Phys. 78, 6745 (1995).
-
(1995)
J. Appl. Phys.
, vol.78
, pp. 6745
-
-
Andreani, L.C.1
De Nova, D.2
Di Lernia, S.3
Geddo, M.4
Guizzetti, G.5
Patrini, M.6
Bocchi, C.7
Bosacchi, A.8
Ferrari, C.9
Franchi, S.10
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