Influence of frictional conditions of microrubbing on pretilt angle of homeotropic liquid crystal cells

Applied Physics Letters

Volumn 88, Issue 3, 2006, Pages 1-3

  Honma, Michinori ^a   Hirata, Kensuke ^a   Nose, Toshiaki ^a  

^a AKITA PREFECTURAL UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROLLABILITY; MICROSCOPES; MICROSCOPIC EXAMINATION; POLYIMIDES; THIN FILMS;

HOMEOTROPIC LIQUID CRYSTAL CELLS; MICRORUBBING; POLARIZING MICROSCOPE; PRETILT ANGLES;

LIQUID CRYSTALS;

EID: 31144469005     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2166688     Document Type: Article

References (18)

1. R. W. Filas and J. S. Patel, Appl. Phys. Lett. 50, 1426 (1987).
2. K.-Y. Han, P. Vetter, and T. Uchida, Jpn. J. Appl. Phys., Part 2 32, L1242 (1993).
3. H. Hatoh, K. Shohara, Y. Kinoshita, and N. Ookoshi, Appl. Phys. Lett. 63, 3577 (1993).
4. C. Nozaki, N. Imamura, and Y. Sano, Jpn. J. Appl. Phys., Part 1 32, 4352 (1993).
5. S. Furumi, M. Nakagawa, S. Morino, and K. Ichimura, Appl. Phys. Lett. 74, 2438 (1999).
6. B. Park, K.-J. Han, Y. Jung, H.-H. Choi, H.-K. Hwang, S. Lee, S.-H. Jang, and H. Takezoe, J. Appl. Phys. 86, 1854 (1999).
7. G. P. Sinha, B. Wen, and C. Rosenblatt, Appl. Phys. Lett. 79, 2543 (2001).
8. M. Honma and T. Nose, Jpn. J. Appl. Phys., Part 2 43, L855 (2004).
9. M. Honma and T. Nose, Appl. Opt. 43, 5193 (2004).
10. Y. Hori, K. Asai, and M. Fukai, IEEE Trans. Electron Devices ED-26, 1734 (1979).
11. N. Chen, A. Suzuki, A. Inada, and K. Kato, Mol. Cryst. Liq. Cryst. Sci. Technol., Sect. A 368, 581 (2001).
12. M. Honma and T. Nose, Jpn. J. Appl. Phys., Part 1 42, 6992 (2003).
13. M. Honma, K. Yamamoto, and T. Nose, J. Appl. Phys. 96, 5415 (2004).
14. S. Varghese, G. P. Crawford, C. W. M. Bastiaansen, D. K. G. de Boer, and D. J. Broer, Appl. Phys. Lett. 85, 230 (2004).
15. E. Meyer, R. Overney, K. Dransfeld, and T. Gyalog, Nanoscience: Friction and Rheology on the Nanometer Scale (World Scientific, Singapore, 1998), Chap., p. 65.
16. D.-S. Seo, K. Araya, N. Yoshida, M. Nishikawa, Y. Yabe, and S. Kobayashi, Jpn. J. Appl. Phys., Part 2 34, L503 (1995).
17. D. Andrienko, Y. Kurioz, Y. Reznikov, C. Rosenblatt, R. G. Petschek, O. D. Lavrentovich, and D. Sebacius, J. Appl. Phys. 83, 50 (1998).
18. Z. Huang and C. Rosenblatt, Appl. Phys. Lett. 86, 011908 (2005).