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Volumn 48, Issue 2, 2006, Pages 215-233
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Linear stability analysis of microinstabilities in electron internal transport barrier non-inductive discharges
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC DISCHARGES;
ELECTRON TRANSITIONS;
ELECTRON TRAPS;
LINEAR SYSTEMS;
CURRENT PROFILES;
ELECTRON INTERNAL TRANSPORT;
GLOBAL CODE;
ELECTRONS;
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EID: 31144454615
PISSN: 07413335
EISSN: 13616587
Source Type: Journal
DOI: 10.1088/0741-3335/48/2/004 Document Type: Article |
Times cited : (22)
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References (26)
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