Reconstructing stratified permittivity profiles using super-resolution techniques

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 1, 2006, Pages 492-498

  Aly, Omar A M ^a,b   Omar, A S ^a,b,c  

^a IEEE

^b OTTO VON GUERICKE UNIVERSITY   (Germany)

^c Department of Electrical Engineering ^*  (Germany)

Author keywords

Electromagnetic scattering; Inverse problems; Microwave imaging; Permittivity; Super resolution

Indexed keywords

MULTIPLE-SIGNAL CLASSIFICATION; SIDELOBE EFFECT; SUPER-RESOLUTION TECHNIQUES;

BANDWIDTH; FREQUENCY DOMAIN ANALYSIS; MAGNETOELECTRIC EFFECTS; MICROWAVES;

PERMITTIVITY;

EID: 31044436000     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2005.860491     Document Type: Conference Paper

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