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Volumn 126, Issue 1, 2006, Pages 159-164

Micro-fabrication of silicon/ceramic hybrid cantilever for atomic force microscope and sensor applications

Author keywords

Atomic force microscope; Micro fabrication; Silicon ceramic hybrid cantilever

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERAMIC MATERIALS; NATURAL FREQUENCIES; PROBES; RESONANCE; SILICON;

EID: 31044434407     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2005.05.005     Document Type: Article
Times cited : (19)

References (11)
  • 6
    • 84953676418 scopus 로고
    • Atomic resolution with the atomic force microsope on conductors and nonconductors
    • T.R. Albrecht, and C.F. Quate Atomic resolution with the atomic force microsope on conductors and nonconductors J. Vac. Sci. Technol. A6 2 1988 271
    • (1988) J. Vac. Sci. Technol. , vol.6 , Issue.2 , pp. 271
    • Albrecht, T.R.1    Quate, C.F.2
  • 7
    • 77952760920 scopus 로고
    • Microfabrication of cantilever styli for the atomic force microscope
    • T.R. Albrecht, S. Akamine, T.E. Carver, and C.F. Quate Microfabrication of cantilever styli for the atomic force microscope J. Vac. Sci. Technol. A8 4 1990 3386
    • (1990) J. Vac. Sci. Technol. , vol.8 , Issue.4 , pp. 3386
    • Albrecht, T.R.1    Akamine, S.2    Carver, T.E.3    Quate, C.F.4
  • 8
    • 84881605956 scopus 로고
    • Micromacined silicon sensors for scanning force microscopy
    • O. Wolter, Th. Bayer, and J. Greschner Micromacined silicon sensors for scanning force microscopy J. Vac. Sci. Technol. B9 2 1991 1353
    • (1991) J. Vac. Sci. Technol. , vol.9 , Issue.2 , pp. 1353
    • Wolter, O.1    Bayer, Th.2    Greschner, J.3
  • 9
    • 0020127035 scopus 로고
    • Silicon as a mechanical material
    • K.E. Peterson Silicon as a mechanical material Proc. IEEE 70 1982 420
    • (1982) Proc. IEEE , vol.70 , pp. 420
    • Peterson, K.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.