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Volumn 76, Issue 1, 2006, Pages 19-26
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Exact likelihood ratio scale and homogeneity testing of some loss processes
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Author keywords
Asymptotic optimality; Gamma distribution; Homogeneity; Likelihood ratio; Loss distribution; Testing; Weibull distribution
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Indexed keywords
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EID: 30944469823
PISSN: 01677152
EISSN: None
Source Type: Journal
DOI: 10.1016/j.spl.2005.06.005 Document Type: Article |
Times cited : (26)
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References (9)
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