T-ray reflection computed tomography

2005 Conference on Lasers and Electro-Optics, CLEO

Volumn 3, Issue , 2005, Pages 2120-2122

  Pearce, Jeremy ^a   Choi, Hyeokho ^a   Mittleman, Daniel M ^a   White, Jeff ^b   Zimdars, Dave ^b  

^a Rice University   (United States)

^b Picometrix Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING SYSTEMS; LIGHT REFLECTION; TIME DOMAIN ANALYSIS;

CROSS-SECTION; TERAHERTZ RADIATION;

TOMOGRAPHY;

EID: 30944456575     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/cleo.2005.202388     Document Type: Conference Paper

References (9)

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