Fast and robust detection of crest lines on meshes

ACM Symposium on Solid Modeling and Applications, SM

Volumn , Issue , 2005, Pages 227-232

  Yoshizawa, Shin ^a   Belyaev, Alexander ^a   Seidel, Hans Peter ^a  

^a MAX PLANCK INSTITUTE FOR INFORMATICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; PARAMETER ESTIMATION; PATTERN MATCHING; POLYNOMIALS; ROBUSTNESS (CONTROL SYSTEMS);

CREST LINES; MESHES; SHAPE MATCHING;

EDGE DETECTION;

EID: 30944452184     PISSN: 18117783     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1060244.1060270     Document Type: Conference Paper

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