Morphological component analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5914, Issue , 2005, Pages 1-15

  Starck, J L ^a,c   Moudden, Y ^a   Bobin, J ^a   Elad, M ^b   Donoho, D L ^c  

^a UNIVERSITÉ PARIS DIDEROT   (France)

^b Stanford University   (United States)

^c STANFORD UNIVERSITY   (United States)

Author keywords

Basis Pursuit Denoising; Blind Source Separation; Curvelet; ICA; Local DCT; Piecewise Smooth; Ridgelet; Sparse Representations; Texture; Total Variation; Wavelet

Indexed keywords

DATA REDUCTION; FEATURE EXTRACTION; TEXTURES; WAVELET TRANSFORMS;

MORPHOLOGICAL COMPONENT ANALYSIS (MCA); PIECEWISE SMOOTH; SPARSE REPRESENTATIONS; TOTAL VARIATION; WAVELET;

MATHEMATICAL MORPHOLOGY;

EID: 30844471763     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.615237     Document Type: Conference Paper

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