Using single-particle sizing to find your process endpoint

Powder and Bulk Engineering

Volumn 15, Issue 5, 2001, Pages 27-38

  Turbitt, Cherie ^a   O'Hagan, Patrick ^b   Hasapidis, Kerry ^b   Nicoli, David ^b   Pokrajac, Greg ^b  

^a Particle Sizing Systems   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 30844447189     PISSN: 08976627     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

1. Most laser diffraction analyzers can examine dry powder samples without special sample preparation. Dry samples must be diluted before analysis by single-particle optical sensing units, which adds preparation time to the sizing analysis.
2. F. Etzler and M. Sanderson, "Particle size analysis: A comparative study of various methods," Particle and Particle Systems Characterization, Volume 12, 1995, pages 217-224.
3. F. Etzler and R. Deanne, "Particle size analysis: A comparative study of various methods II," Particle and Particle Systems Characterization, Volume 14, 1997, pages 278-282.
4. P. O'Hagan, K. Hasapidis, D. Nicoli, and G. Pokrajac, "SPOS: A unique tool for sizing aggregates," Proceedings of the 1999 Fine Powder Processing International Conference, Pennsylvania State University, University Park, Pa., September 1999.
5. Laser diffraction sizing analyses were performed by Particle Sizing Systems' customers in their own facilities using various analyzer models; single-particle sizing analyses were performed at customer facilities by Particle Sizing Systems using the company's AccuSizer 780 optical particle sizer. All tests were performed between 1998 and 2000. For more test information, contact the authors.
6. K. Nicholes, MR. Litchy, D.C. Grant, and R.K. Singh, "Perturbation detection analysis: A method for comparing instruments that can measure the presence of large particles in CMP slurry," Proceedings of SEMICON/West, San Diego, Calif., July 2000.