Investigation into the binding of gold nanoparticles to fingermarks using scanning electron microscopy

Journal of Forensic Identification

Volumn 56, Issue 1, 2006, Pages 24-32

  Choi, Mi Jung ^a   McBean, Katie E ^b   Wuhrer, Richard ^b   McDonagh, Andrew M ^a   Maynard, Philip J ^a   Lennard, Chris ^c   Roux, Claude ^a  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^b UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

^c AFP Forensic Services   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; NANOPARTICLE;

ANALYTIC METHOD; ARTICLE; BINDING AFFINITY; CONCENTRATION RESPONSE; FINGER DERMATOGLYPHICS; FORENSIC IDENTIFICATION; HUMAN; MULTIMETAL DEPOSITION; PH MEASUREMENT; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY;

EID: 30844440113     PISSN: 0895173X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

1. Jones, N.; Lennard, C.; Stoilovic, M.; Roux, C. An Evaluation of Multimetal Deposition 11. J. For. Ident. 2002, 53 (4), 444-480.
2. Schnetz, B. La Revelation des Empreintes Digitales Par L'or Colloidal: L'amplification du Signal Par Les Techniques Biochemiques. Ph.D. Thesis, Institut de Police Scientifique et de Criminologie, Universite de Lausanne, Lausanne, Switzerland, 1999.
3. Saunders, G. Multimetal Deposition Technique for Latent Fingerprint Development. Presented at The International Association for Identification, 74th Annual Educational Conference, June, Pensacola, USA, 1989.
4. Allman, D.; Maggs, S.; Pounds, C. The Use of Colloidal Gold/Multimetal Deposition for the Detection of Latent Fingerprints -A Preliminary Evaluation. Central Research and Support Establishment Report No. 747, Home Office Forensic Science Service, U.K., 1992.
5. Schnetz, B.; Margot, P. Technical note: Latent Fingermarks, Colloidal Gold and Multimetal Deposition (MMD) Optimisation of the Method. For. Sci. Int. 2001, 118, 21-28.
6. Goldstein, J. I.; Romig, A. D.; Newbury, D. E.; Lyman, C. E.; Echlin, P.; Fiori, C.; Joy, D. C.; Lifshin, E. Scanning Electron Microscopy and X-Ray Microanalysis, 2nd Ed; Plenum Press: New York, 1992.