Scaling properties of the diffusion process underlying the havriliak-negami relaxation function

Defect and Diffusion Forum

Volumn 237-240, Issue PART 2, 2005, Pages 1093-1100

  Weron, Karina ^a   Jurlewicz, Agnieszka ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Continuous time random walk; Havriliak Negami function; Limit theorem; Power law dielectric response; Relaxation phenomenon

Indexed keywords

FUNCTIONS; RELAXATION PROCESSES; THEOREM PROVING;

CONTINUOUS-TIME RANDOM WALK; LIMIT THEOREM; POWER-LAW DIELECTRIC RESPONSE; RALAXATION PHENOMENON;

DIFFUSION;

EID: 30844436137     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/ddf.237-240.1093     Document Type: Conference Paper

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