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Journal of Materials Science

Volumn 40, Issue 23, 2005, Pages 6329-6331

Dielectric properties of SrBi2Ta2O9 films in the low-temperature range

(3) Yang, Pingxiong a Guo, Ming a Shi, Meirong a

a EAST CHINA NORMAL UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH; CAPACITANCE; DIELECTRIC PROPERTIES; LOW TEMPERATURE EFFECTS; MICROSTRUCTURE; POLARIZATION; STRONTIUM; THIN FILMS; VOLTAGE MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC STRUCTURE; ELECTRICALLY TUNABLE MICROWAVE DEVICES; SBT FILMS; SWITCHABLE POLARIZATION;

STRONTIUM COMPOUNDS;

EID: 30744462070 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-005-3684-y Document Type: Article

Times cited : (4)

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