Effect of harsh anneals on the LSM/YSZ interfacial impedance profile

Electrochimica Acta

Volumn 51, Issue 8-9, 2006, Pages 1585-1591

  Smith, Jeremiah R ^a   Wachsman, Eric D ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

AC impedance spectroscopy; Cathodic reaction; Interfacial microstructure; LSM; YSZ

Indexed keywords

ANNEALING; ENERGY DISPERSIVE SPECTROSCOPY; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SURFACE CHEMISTRY;

AC IMPEDANCE SPECTROSCOPY; CATHODIC REACTION; LSM; YSZ;

ELECTRIC IMPEDANCE;

EID: 30744461854     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2005.02.112     Document Type: Conference Paper

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