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Volumn 237-240, Issue PART 2, 2005, Pages 1163-1167
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In-situ observation of electromigration in gold nanowires
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Author keywords
Electromigration; Nanowires; Resistance
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Indexed keywords
ELECTRIC RESISTANCE;
ELECTROMIGRATION;
ELECTRON BEAM LITHOGRAPHY;
NANOSTRUCTURED MATERIALS;
NUCLEATION;
SCANNING ELECTRON MICROSCOPY;
WIRE;
NANOWIRES;
VOIDS;
WIRE RESISTANCE;
GOLD;
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EID: 30744451163
PISSN: 10120386
EISSN: 16629507
Source Type: Journal
DOI: 10.4028/www.scientific.net/ddf.237-240.1163 Document Type: Conference Paper |
Times cited : (7)
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References (16)
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