In-situ observation of electromigration in gold nanowires

Defect and Diffusion Forum

Volumn 237-240, Issue PART 2, 2005, Pages 1163-1167

  Stahlmecke, Burkhard ^a   Dumpich, Guenter ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

Electromigration; Nanowires; Resistance

Indexed keywords

ELECTRIC RESISTANCE; ELECTROMIGRATION; ELECTRON BEAM LITHOGRAPHY; NANOSTRUCTURED MATERIALS; NUCLEATION; SCANNING ELECTRON MICROSCOPY; WIRE;

NANOWIRES; VOIDS; WIRE RESISTANCE;

GOLD;

EID: 30744451163     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/ddf.237-240.1163     Document Type: Conference Paper

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