Fabric Surface Roughness Evaluation Using Wavelet-Fractal Method: Part II: Fabric Pilling Evaluation

Textile Research Journal

Volumn 75, Issue 11, 2005, Pages 761-770

  Kim, Soo Chang ^a   Kang, Tae Jin ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; EIGENVALUES AND EIGENFUNCTIONS; FRACTALS; MATRIX ALGEBRA; SCANNING; SURFACE ROUGHNESS; WAVELET TRANSFORMS;

FABRIC PILLING; NEURAL NETWORK CLASSIFIERS; SCANNING SYSTEM; WAVELET-FRACTAL METHOD;

FABRICS;

SURFACE PROPERTY;

EID: 30744434380     PISSN: 00405175     EISSN: None     Source Type: Journal    
DOI: 10.1177/0040517505059209     Document Type: Article

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