Growth mechanisms of electrodeposited CuInSe2 and Cu(In,Ga)Se2 determined by cyclic voltammetry

Materials Research Society Symposium Proceedings

Volumn 865, Issue , 2005, Pages 431-436

  Calixto, M Estela ^a   Dobson, Kevin D ^a   McCandless, Brian E ^a   Birkmire, Robert W ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; CYCLIC VOLTAMMETRY; ELECTRODEPOSITION; X RAY DIFFRACTION ANALYSIS;

COPPER SELENIDES; CRYSTALLINITY; GLANCING INCIDENCE X-RAY DIFFRACTION (GIXRD) DATA;

COPPER COMPOUNDS;

EID: 30544450350     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-865-f14.17     Document Type: Conference Paper

References (7)

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