|
Volumn 73, Issue 1, 2006, Pages 104-109
|
Topological defects, pattern evolution, and hysteresis in thin magnetic films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 30544447075
PISSN: 02955075
EISSN: None
Source Type: Journal
DOI: 10.1209/epl/i2005-10367-8 Document Type: Article |
Times cited : (11)
|
References (22)
|