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Volumn 73, Issue 1, 2006, Pages 104-109

Topological defects, pattern evolution, and hysteresis in thin magnetic films

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Indexed keywords


EID: 30544447075     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2005-10367-8     Document Type: Article
Times cited : (11)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.