Transport and fluctuations during electrode biasing on TJ-II

Czechoslovak Journal of Physics

Volumn 55, Issue 12, 2005, Pages 1589-1596

  Silva, C ^a   Goncalves, B ^a   Pedrosa, M A ^b   Hidalgo, C ^b   McCarthy, K ^b   Calderon E ^b   Herranz, J ^b   Pastor, I ^b   Orozco, O ^b  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b CIEMAT   (Spain)

Author keywords

Biasing; Edge transport; Enhanced confinement

Indexed keywords

EID: 30544445091     PISSN: 00114626     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10582-006-0044-3     Document Type: Article

References (4)

1. C. Hidalgo et al.: Plasma Phys. Control. Fusion 46 (2004) 287.
2. C. Hidalgo, M. A. Pedrosa et al.: Phys. Rev. E 70, 067402 (2004).
3. M.A. Pedrosa et al.: Plasma Phys. Control. Fusion, 47 (2005) 777.
4. C. Silva et al.: Nucl. Fusion 44 (2004) 799.