Combined excitation emission spectroscopy of europium ions in GaN and AlGaN films

Materials Research Society Symposium Proceedings

Volumn 866, Issue , 2005, Pages 73-78

  Dierolf, V ^a   Fleischman, Z ^a   Sandmann, C ^a   Wakahara, A ^b   Fujiwara, T ^b   Munasinghe, C ^c   Steckl, A ^c  

^a LEHIGH UNIVERSITY   (United States)

^b TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

^c University of Cincinnati   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; ALUMINUM NITRIDE; EMISSION SPECTROSCOPY; EUROPIUM; GALLIUM ALLOYS; GALLIUM NITRIDE;

BROADENING; GROWTH CONDITIONS;

THIN FILMS;

EID: 30544443367     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-866-v3.6     Document Type: Conference Paper

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