Characterization of the silicon-based thin film multi-junction solar cells

Materials Research Society Symposium Proceedings

Volumn 862, Issue , 2005, Pages 579-590

  Hishikawa, Yoshihiro ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; SEMICONDUCTOR JUNCTIONS; SOLAR CELLS; THIN FILMS; XENON;

COMPONENT CELLS; I-V CURVES; MULTI-JUNCTIONS; SPECTRAL RESPONSE;

SILICON;

EID: 30544442519     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-862-a23.1     Document Type: Conference Paper

References (13)

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