Real time monitoring of the crystallization of hydrogenated amorphous silicon

Materials Research Society Symposium Proceedings

Volumn 862, Issue , 2005, Pages 227-232

  Stradins, Paul ^a   Young, David ^a   Branz, Howard M ^a   Page, Matthew ^a   Wang, Qi ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; OPTICAL PROPERTIES; REFLECTION; SPECTROSCOPIC ANALYSIS; WAVE INTERFERENCE;

OPTICAL REFLECTANCE SPECTROSCOPY; POLYCRYSTALLIN EPHASES;

REAL TIME SYSTEMS;

EID: 30544440730     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-862-a16.1     Document Type: Conference Paper

References (11)

1. W. Fuhs, S. Gall, B. Rau, M. Schmidt and J. Schneider, Sol. Energy 77 (2004) 961.
2. A. G. Aberle, A. Straub, P. I. Widenborg, A. B. Sproul, Y. Huang and P. Campbell, Prog. Photovoltaics 13 (2005) 37.
3. P. A. Basore, 31st IEEE Photovoltaic Specialists Conference (2005)
4. In: Semiconductors - Basic Data, ed. by O. Madelung (Springer, 1996).
5. M. Reinelt, S. Kablitzer and G. Moller, J. Non-Cryst. Sol. 59-60 (1983) 169.
6. K. Zellama, P. Germain, S. Squelard, J. C. Bourgoin and P. A. Thomas, J. Appl. Phys. 50 (1979) 6995.
7. N. A. Blum and C. Feldman, Bull. Amer. Phys. Soc. 21 (1976) 334.
8. R. B. Iverson and R. Reif, J. Appl. Phys. 62 (1987) 1679.
9. D. L. Young, P. Stradins, B. Roy, E. Iwaniczko, B. To, B. Reedy, D. Ginley, H. M. Branz and Q. Wang, this volume (2005)
10. M. Bauer, M. Oehme, M. Sauter, G. Eifler and E. Kasper, Thin Solid Films 364 (2000) 238.
11. S. A. Kokorowski, G. L. Olson and L. D. Hess, J. Appl. Phys. 53 (1982) 921.