Efficiency limitations of multicrystalline silicon solar cells due to defect clusters

Materials Research Society Symposium Proceedings

Volumn 864, Issue , 2005, Pages 233-240

  Sopori, Bhushan ^a   Li, Chuan ^a   Narayanan, S ^b   Carlson, D ^b  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Solarex Court ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DEFECTS; IMPURITIES; PRECIPITATION (CHEMICAL); SOLAR CELLS; WSI CIRCUITS;

DEFECT CLUSTERS; IMPURITY PRECIPITATION;

SILICON;

EID: 30544436948     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-864-e6.2     Document Type: Conference Paper

References (8)

1. B. L. Sopori, Proc. ICDS-19, Trans Tech Pub., Edited by G. Davies and M.H. Nazare, 527 (1997).
2. PVSCAN uses optical scattering from a defect-etched wafer to statistically count defects. It is also fitted with capabilities to make LBIC and reflectance measurements at 0.63 μm and 0.98 μm. It is available from GT Solar Technologies, Nashua, NH 03054. Also, see B.L. Sopori, US Patent 5,581,346.
3. B. L. Sopori, J. Electrochem. Soc., 131, 667 (1984).
4. T. Buonassisi, O. F. Vyvenko, A. A. Istratov, E. R. Weber, G. Hahn, D. Sontag, J. P. Rakotoniaina, O. Breitenstein, J. Isenberg, and R. Schindler, J. Appl. Phys. 95, 1556 (2004).
5. B.L. Sopori and R. A. Murphy, The Proceedings of 12th European Photovoltaic Solar Energy Conference, 1797, April 1994, Amsterdam, The Netherlands
6. J. G. Possum and F. A. Lindholm., IEEE Trans. ED-27, 692(1980).
7. B. L. Sopori, R. A. Murphy, and C. Marshall, Proceedings of the 23rd IEEE Photovoltaic Specialists Conference, Louisville, Kentucky May 10-14, 190 (1993).
8. B. L. Sopori, Appl. Phys. Lett, 52, 1718 (1988).