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Volumn 200, Issue 8, 2006, Pages 2725-2730
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Texture and microstructure of ZrO2-4mol% Y2 O3 layers obliquely deposited by EB-PVD
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Author keywords
Electron beam evaporation; Monte Carlo simulation; Scanning electron microscopy (SEM); Thermal barrier coatings; X ray diffraction; Zirconium oxide
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Indexed keywords
CRYSTAL GROWTH;
CRYSTAL MICROSTRUCTURE;
CRYSTALLOGRAPHY;
EVAPORATION;
MONTE CARLO METHODS;
PHYSICAL VAPOR DEPOSITION;
POROSITY;
SCANNING ELECTRON MICROSCOPY;
TEXTURES;
X RAY DIFFRACTION ANALYSIS;
YTTRIUM COMPOUNDS;
ZIRCONIA;
COATING LAYERS;
ELECTRON BEAM EVAPORATION;
ELECTRON BEAM PHYSICAL VAPOR DEPOSITION;
VAPOR INCIDENT ANGLE (VIA);
THERMAL BARRIER COATINGS;
COATING;
MICROSTRUCTURE;
ZIRCONIUM OXIDE;
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EID: 30544431609
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2005.02.121 Document Type: Article |
Times cited : (26)
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References (21)
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