Modeling threats

IEEE Potentials

Volumn 23, Issue 3, 2004, Pages 18-21

  Singh, Satnam ^a   Tu, Haiying ^a   Allanach, Jeffrey ^a   Areta, Javier ^a   Willett, Peter ^a   Pattipati, Krishna ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

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Indexed keywords

EID: 30444455042     PISSN: 02786648     EISSN: None     Source Type: Journal    
DOI: 10.1109/MP.2004.1341780     Document Type: Review

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