Orthogonal projection approach applied to peak purity assessment

Analytical Chemistry

Volumn 68, Issue 1, 1996, Pages 79-85

  Cuesta Sanchez F ^a   Toft, J ^a   Van den Bogaert, B ^a   Massart, D L ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3043001146     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac950496g     Document Type: Article

References (18)

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