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Volumn 53, Issue 3, 1996, Pages 965-968

Electronic states of the θ′ phase in Cu-Al alloys as compared to C16: Cu Lα emission excited directly by undulator radiation

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EID: 3042993953     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.965     Document Type: Article
Times cited : (3)

References (24)
  • 2
    • 0022934609 scopus 로고    scopus 로고
    • J. B. Cohen, in Solid State Physics, edited by H. Ehrenreich and D. Turnbull (Academic, New York, 1986), Vol. 39, p. 131, and references quoted therein.
    • Solid State Physics , vol.39 , pp. 131
    • Cohen, J.1
  • 6
    • 85037903861 scopus 로고
    • In related research on Cu-Al, the greater surface sensitivity of XPS forced the growth of samples in situ by evaporation [P. Steiner, H. Höchst, W. Steffen, and S. Hüfner, Z. Phys. B 38, 191 (1980)]: this adds other problems due to differences between thin films and bulk samples [M. Parkes, S. J. Krause and S. R. Wilson, Appl. Phys. Lett. 64, 721 (1994)].
    • (1980) P. Steiner, H. Höchst, W. Steffen, and S. Hüfner, Z. Phys. B , vol.38 , pp. 191
  • 22
    • 36049056204 scopus 로고
    • V. Heine, Phys. Rev. 153, 673 (1967), and references quoted therein.
    • (1967) Phys. Rev. , vol.153 , pp. 673
    • Heine, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.