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Volumn 7, Issue 4, 1998, Pages 553-561
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Absolute measurements of the second order susceptibilities of ZnSe, ZnTe and ZnS
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Author keywords
[No Author keywords available]
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Indexed keywords
II-VI SEMICONDUCTORS;
LIGHT SOURCES;
NONLINEAR OPTICS;
SELENIUM COMPOUNDS;
SULFUR COMPOUNDS;
TELLURIUM COMPOUNDS;
VANADIUM COMPOUNDS;
YLF LASERS;
ZINC SELENIDE;
ZINC SULFIDE;
ABSOLUTE MEASUREMENTS;
FUNDAMENTAL WAVELENGTH;
ND:YLF LASER;
OSCILLATION TECHNIQUE;
Q-SWITCHED;
SECOND ORDERS;
SECOND-ORDER SUSCEPTIBILITY;
SINGLE-CRYSTALLINE;
FLUORINE COMPOUNDS;
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EID: 3042988471
PISSN: 02188635
EISSN: None
Source Type: Journal
DOI: 10.1142/S0218863598000405 Document Type: Article |
Times cited : (11)
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References (10)
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