Characterization of multiphase diffusion zones by means of lattice source interferences

Defect and Diffusion Forum

Volumn 143-147, Issue , 1997, Pages 609-614

  Kurt, R ^a,b   Dabritz S ^a   Haufte, W ^a   Bergner, D ^c   Richter, K ^c  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b IFW DRESDEN   (Germany)

^c TU BERGAKADEMIE FREIBERG   (Germany)

Author keywords

AuTi; Electron Probe Microanalysis; Kossel Technique

Indexed keywords

EID: 3042959990     PISSN: 10120386     EISSN: 16629507     Source Type: Journal    
DOI: 10.4028/www.scientific.net/ddf.143-147.609     Document Type: Article

References (11)

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