Radiation hardening techniques for commercially produced microelectronics for space guidance and control applications

Advances in the Astronautical Sciences

Volumn 94, Issue , 1997, Pages 169-180

  Brothers Jr , Charles P ^c   Chavez, Joseph R ^a   Alexander, David R ^c   Mavis, David G ^b  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b MISSION RESEARCH CORPORATION   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3042868790     PISSN: 00653438     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)

1. Ma, T.P. and Dressendorfer, P.V. (ed), Ionizing Radiation Effects in MOS Devices and Circuits, Wieley, New York, 1989.
2. R.W. Tallon, et al, "5 to 160 keV Continuos Wave X-Ray Spectral Energy Distribution and Energy Flux Density Measurements." IEEE Trans. Nuc. Sc., Vol. NS-41. pp. 2112-17 (Dec. 1994).
3. J. L. Azarewicz, "Single Event Test Report: Dual Register File Microcircuits", 25 August 1996, Mission Research Corporation.