Measurement of characteristic X-rays by positron impact

Materials Science Forum

Volumn 445-446, Issue , 2004, Pages 440-442

  Nagashima, Yasuyuki ^a,c   Saito, Fuminori ^b   Itoh, Yoshiko ^b   Goto, Akira ^b   Hyodo, Toshio ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^c NONE   (Japan)

Author keywords

Characteristic X Rays; Inner Shell Ionization Cross Section

Indexed keywords

ALUMINUM; AMPLIFIERS (ELECTRONIC); APPROXIMATION THEORY; COULOMB BLOCKADE; IONIZATION; POSITRONS; SILICON; SPECTRUM ANALYSIS;

CHARACTERISTIC X-RAYS; INNER-SHELL IONIZATION CROSS-SECTION; PLANE-WAVE BORN APPROXIMATION (PWBA); POSITRON IMPACT;

X RAYS;

EID: 3042853268     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.445-446.440     Document Type: Conference Paper

References (10)

1. H. Hansen, H. Weigmann, and Flammersfeld: Nucl. Phys. Vol. 58 (1964), p. 241.
2. H. Hansen and A. Flammersfeld: Nucl. Phys. Vol. 79 (1966), p. 135.
3. S. A. H. Seif el Nasr, D. Berényi, and Gy. Bibok: Z. Phys. Vol. 271 (1974), p. 207.
4. U. Schiebel, E. Bentz, A. Müller, E. Salzborn, and H. Tawara, Phys. Lett. Vo. 59A (1976), p. 274.
5. S. Ito, S. Shimizu, T. Kawaratani, and K. Kubota: Phys. Rev. A Vol. 22 (1980), p. 407.
6. P. J. Schultz and J. L. Campbell: Phys. Lett. Vol. 112A (1985), p. 316.
7. H. Schneider, I. Tobehn, F. Ebel and R. Hippler: Phys. Rev. Lett. Vol. 71 (1993), p. 2707.
8. F. Saito, Y. Nagashima, L. Wei, Y. Itoh, A. Goto and T. Hyodo: Appl. Surf. Sci. Vol. 194 (2002), p. 13.
9. S. P. Khare and J. M. Wadehra; Can. J. Phys. Vol. 74 (1996), p. 376.
10. Y. Nagashima, F. Saito, Y. Itoh, A. Goto and T. Hyodo: in preparation.