Surface roughness effects on the magnetization reversal of polycrystalline Fe/Ag thin films

Solid State Communications

Volumn 131, Issue 6, 2004, Pages 359-363

  Swerts, J ^a   Vandezande, S ^a   Temst, K ^a   Van Haesendonck, C ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

A. Magnetic films and multilayers; C. Surface roughness; D. Magnetic properties

Indexed keywords

ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; HYSTERESIS; KERR MAGNETOOPTICAL EFFECT; MAGNETIC RECORDING; MAGNETIZATION; MAGNETORESISTANCE; MORPHOLOGY; MULTILAYERS; POLYCRYSTALLINE MATERIALS; SURFACE ROUGHNESS;

MAGNETIC FILMS AND MULTILAYERS; MAGNETIZATION REVERSAL; MAGNETO-ELECTRONICS; X-RAY REFLECTOMETRY (XRR);

MAGNETIC THIN FILMS;

EID: 3042830850     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.05.045     Document Type: Article

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