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Volumn 75, Issue 6, 2004, Pages 2163-2170
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Analysis of ion dynamics and peak shapes for delayed extraction time-of-flight mass spectrometers
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Author keywords
[No Author keywords available]
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Indexed keywords
ACCELERATION;
DESORPTION;
ELECTRIC FIELD EFFECTS;
IONIZATION;
LASER BEAM EFFECTS;
MAGNETIC LEAKAGE;
MATHEMATICAL MODELS;
SPECTRUM ANALYSIS;
ELECTROSTATIC MIRRORS;
ENERGY DISTRIBUTION;
TIME-OF-FLIGHT MASS SPECTROMETERS (TOF-MS);
MASS SPECTROMETERS;
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EID: 3042814439
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1711161 Document Type: Article |
Times cited : (8)
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References (20)
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